5G Technology World

  • 5G Technology and Engineering
  • FAQs
  • Apps
  • Devices
  • IoT
  • RF
  • Radar
  • Wireless Design
  • Learn
    • 5G Videos
    • Ebooks
    • EE Training Days
    • FAQs
    • Learning Center
    • Tech Toolboxes
    • Webinars/Digital Events
  • Handbooks
    • 2024
    • 2023
    • 2022
    • 2021
  • Resources
    • Design Guide Library
    • EE World Digital Issues
    • Engineering Diversity & Inclusion
    • Engineering Training Days
    • LEAP Awards
  • Advertise
  • Subscribe

AIRCOM Device Test Lab Strengthens Carrier Aggregation and LBS Testing Services

By Staff Author | September 10, 2014

As market demand for 4G/LTE devices utilizing advanced features such as carrier aggregation, A-GNSS and OTDOA/eCID location based services ramps-up, TEOCO’s AIRCOM Device Test Lab stands ready to meet industry testing and certification needs

Columbia, MD — TEOCO has expanded the testing capabilities of its AIRCOM Device Test Lab with additional test systems from Rohde & Schwarz. Combined with Rohde & Schwarz’ extensive conformance and carrier test case support, the R&S TS-LBS Location Based Services (LBS) and the R&S CMW-PQA Performance Test Systems, enable TEOCO to support new industry and carrier testing requirements for next-generation wireless technologies including carrier aggregation, IMS, VoLTE, RCS, E911 over IMS, LTE A-GNSS, LTE OTDOA and LTE eCID.

Release 10 and beyond, also referred to as LTE-Advanced, allows for a substantial uplift in the capacity and throughput of LTE, in addition to mobile device performance improvements. In LTE-Advanced, carrier aggregation (CA) is a key feature that allows the combination of multiple carriers to increase bandwidth and ultimately data rates in the network. To meet this need, the R&S CMW-PQA test system performs automated testing of a devices downlink, uplink and bidirectional data performance with or without carrier aggregation under simulated network conditions.

LBS is already a key technology enabling a myriad of new applications that people depend on every day. LTE and additional satellite constellations are being leveraged to improve availability and performance of location technologies indoors and outdoors. Higher customer expectations are driving the need for more advanced testing methodologies, and the R&S TS-LBS test system supports field-to-lab testing where real-world conditions are captured with high performance 16-bit resolution, and replayed in the lab for more accurate simulation.

“We are excited to expand our testing capability and capacity for LTE-Advanced and LBS-enabled devices,” said Hemant Minocha, Executive Vice President at TEOCO. “And given the increase in test complexity and costs, we are pleased to be working with a partner such as Rohde & Schwarz whose expertise in conformance and carrier acceptance testing and breadth of test cases helps future-proof our investment while delivering the quality and results our customers have come to expect.”

For more information, visit www.teoco.com and www.rhodeschwarz.com.


Filed Under: RF

 

Next Article

← Previous Article
Next Article →

Related Articles Read More >

Butler Matrix
Butler Matrix drives Wi-Fi and other phased-array antennas
Long-wire dipole antennas: still viable after more than a century
RemCom Wireless InSite 4.0
Software simulates RF conditions from the Earth to the Moon
FAQ on the Butler matrix for beamforming: part 2

Featured Contributions

  • Overcome Open RAN test and certification challenges
  • Wireless engineers need AI to build networks
  • Why AI chips need PCIe 7.0 IP interconnects
  • circuit board timing How timing and synchronization improve 5G spectrum efficiency
  • Wi-Fi 7 and 5G for FWA need testing
More Featured Contributions

EE TECH TOOLBOX

“ee
Tech Toolbox: 5G Technology
This Tech Toolbox covers the basics of 5G technology plus a story about how engineers designed and built a prototype DSL router mostly from old cellphone parts. Download this first 5G/wired/wireless communications Tech Toolbox to learn more!

EE LEARNING CENTER

EE Learning Center
“5g
EXPAND YOUR KNOWLEDGE AND STAY CONNECTED
Get the latest info on technologies, tools and strategies for EE professionals.

Engineering Training Days

engineering
“bills
5G Technology World
  • Enews Signup
  • EE World Online
  • DesignFast
  • EDABoard Forums
  • Electro-Tech-Online Forums
  • Microcontroller Tips
  • Analogic Tips
  • Connector Tips
  • Engineer’s Garage
  • EV Engineering
  • Power Electronic Tips
  • Sensor Tips
  • Test and Measurement Tips
  • About Us
  • Contact Us
  • Advertise

Copyright © 2025 WTWH Media LLC. All Rights Reserved. The material on this site may not be reproduced, distributed, transmitted, cached or otherwise used, except with the prior written permission of WTWH Media
Privacy Policy

Search 5G Technology World