Keysight Technologies, Inc. (Santa Rosa, CA) will demonstrate in-circuit, functional and boundary scan test solutions at IPC APEX EXPO, Booth 3815, San Diego Convention Center, Feb. 24-26.

Keysight experts will demonstrate:

• The versatile Keysight x1149 benchtop boundary scan analyzer, winner of EDN’s 2014 Best-in-Test Award. The x1149 offers quick test turnaround and extensive coverage, from design and validation to new product introduction and mass manufacturing. Demonstrations of the x1149 will also include testing of solid state drives.
• The Keysight TS-8989A PXI Functional Test System, which provides manufacturers with a cost effective, integrated PXI-based measurement, switch and load system-in-a-box, ideal for industrial and automotive functional test applications.
• The low-cost Keysight Medalist i1000D ICT, which has the smallest manufacturing footprint in the market. This system comes complete with an integrated board handler for automating manufacturing tests of smartphones, LEDs, automotive fuse boxes and more. The i1000D includes powerful capabilities such as digital testing, boundary scan, Cover-Extend Technology (CET) and Keysight VTEP.
• The fully integrated inline Keysight Medalist i3070 Series 5 in-circuit test system with short-wire fixturing, known for its ease of test, transportability and repeatability. This award-winning suite includes limited-access testing, an easy-to-use interface, improved test development and debug tools, and innovative features such as VTEP v2.0.
• The Keysight i1000D DTS is a custom diagnostics test set. The test set provides faster prototype turn-on and precise repair diagnostics making it the ideal solution for R&D, repair and functional test.
• Solution partner Derby Associates International will join Keysight in the booth demonstrating web-based data collection and analytics which allow electronics companies to improve performance and quality by helping them make better decisions faster.

For more information visit www.keysight.com/find/ict.