Integrate a 5G Open RAN L1-L3 software stack into a small-cell design.
OFC 2024: It’s AI or die
Today’s data rates are already too slow, and so are tomorrow’s. Expect more complaints about slow networks in 2025.
Small footprint 3GPP 5G conformance test systems perform RF and radio-resource tests
Rohde & Schwarz has developed two additions for its R&S TS8980 family: the R&S TS8980S-4A and the R&S TS8980FTA-3A.
Wireless tester performs Wi-Fi 7 PHY and MAC layer tests
Keysight’s E7515W lets you test Wi-Fi 7 chipsets and systems. As Wi-Fi 7 (802.11be) chipsets, routers, access points, and mobile devices come into production, engineers need to test them for RF conformance and for protocol functionality. Keysight automates those tasks by adding Wi-Fi 7 testing with the E7515W. A variant on its UXM test platform,…
GPS at 50: Now what?
EE World interviewed Microchip’s David Chandler and Duke Buckner on the status and future of GPS, a technology we rely on for location tracking and network timing. Ethernet isn’t the only ubiquitous technology invented in 1973. GPS, the network of satellites that provide location and timing information, was also born that year. GPS has come…
Ethernet turned 50 in 2023, what’s next?
EE World interviewed John D’Ambrosia, who told a few stories from earlier times and gave a peek at what’s coming next from the IEEE 802.3 set of standards.
How trace roughness, glass weave, and stackup affect signal integrity
How do circuit board materials and construction affect the integrity of signals that travel across the board?
Video: Research at NYU Wireless and Nokia aims for 6G
Upper mid-band frequencies, above 100 GHz frequencies, and integrated sensing are some of the projects that could find their way into cellular networks. At the 2023 NYU Brooklyn 6G Summit, EE world met with Prof. Sundeep Rangan, associate director of NYU Wireless and Peter Vetter, president of core research at Nokia Bell Labs to discuss…
6G conference exhibits demonstrate possible technologies
At the 6G Symposium and 6G Summit, attendees saw the latest research that could lead to the next generation of wireless.
Open RAN: Interoperability is not plug-and-play
EE World spoke with Adam Smith of LitePoint about the progress and challenges of Open RAN interoperability and testing.